Identification and analysis of the technology potential of machine learning systems in the production of the future

Authors: 
Schuh, G.; Scholz, P.; Leich, T.; May, R.
Title of journal: 
IEEE Information Technology and Management Science Conference 2020
Year: 
2020
Relevant pages: 
1-10
DOI: 

10.1109/ITMS51158.2020.9259303

Open access: 
Yes
SCI: 
No
Kiemelt: 
No
Pdf: 
No
Place of publication: